dc.contributor.author |
Sofia, Aya |
|
dc.date.accessioned |
2020-05-24T23:24:29Z |
|
dc.date.available |
2020-05-24T23:24:29Z |
|
dc.date.issued |
2018 |
|
dc.identifier.uri |
http://repository.president.ac.id/xmlui/handle/123456789/2745 |
|
dc.description.abstract |
PT. MN has a project to construct a production line of biscuit product to expand the export business. During early production, found that the highest defect were produced in the Oven Area. The defect percentage in the oven area is reaching 40% out of production output. This research discusses how to decrease the number of product defect and increase its process capability in oven area. The parameter used to measure the process capability are Critical to Product (CTP) and Critical to Quality (CTQ) aspect. The CTP and CTQ parameter were decided based on the Voice of Customer that collected previously. This research would use Six Sigma and DMAIC approach as the research method. The focus would be thickness data with the highest defect percentage that reached 31.25% out of all defect in oven area. The result of research shows that the parameter has increasing quality and process capability. The thickness defect percentage decreasing by 16.96% and the p value increased from 0.025 to 0.075 while the capability also increased thus improve the sigma level from 1.99 to 2.88. |
en_US |
dc.language.iso |
en_US |
en_US |
dc.publisher |
President University |
en_US |
dc.relation.ispartofseries |
Industrial Engineering;004201400013 |
|
dc.subject |
DMAIC |
en_US |
dc.subject |
Process Capability |
en_US |
dc.subject |
Defect reduction |
en_US |
dc.subject |
Six Sigma |
en_US |
dc.subject |
Quality |
en_US |
dc.title |
DMAIC METHODOLOGY IMPLEMENTATION TO REDUCE DEFECT IN OVEN AREA AT PT. MN |
en_US |
dc.type |
Thesis |
en_US |