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AI - DRIVEN CRIMINAL SUSPECT IDENTIFICATION AND SKETCH GENERATION

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dc.contributor.author Firdaus, Alban Muhammad Satria
dc.date.accessioned 2025-12-11T01:41:15Z
dc.date.available 2025-12-11T01:41:15Z
dc.date.issued 2025
dc.identifier.uri http://repository.president.ac.id/xmlui/handle/123456789/13232
dc.description.abstract The "AI-Driven Criminal Suspect Identification and Sketch Generation" initiative intends to improve criminal investigations by assisting in the identification of suspects and the creation of sketches. The initiative identified issues that INAFIS investigators face, such as taking too long to find suspects and solve cases because the sketches they create are inaccurate. The investigation focused on ethical and legal considerations, as well as how to ensure that AI employed in criminal identification is fair and secure. The new technologies will enable INAFIS professionals to collaborate more efficiently and correctly when identifying suspects. These tools include automatic sketch creation, 3D modeling, and real-time collaboration. The chosen solution, Alternative 3 - AI-powered Criminal Suspect Identification and Sketch Generation, aligns with the project's goal of making criminal identification easier. Examples demonstrate how the AI system integrates well with the way investigators now work. It gives them a useful tool for their tasks. Estimating the time and resources needed for a project, including people, machines, tools, and costs, is a careful plan. It will take four months to do all the planning, research, creating, testing, making changes, and finishing the project. In short, the project thinks about the rules and laws, as well as how things work, and has a clear plan to make criminal investigations better and solve cases faster. It could change how we do things. en_US
dc.language.iso en en_US
dc.publisher President University en_US
dc.relation.ispartofseries Information Technologies;001202100104
dc.title AI - DRIVEN CRIMINAL SUSPECT IDENTIFICATION AND SKETCH GENERATION en_US
dc.type Thesis en_US


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